The role of self interstitials in As+ diffusion of implanted silicon

Publication date: 31 Gen 2021

BookSource: LEGACY

Arsenic implanted specimens after liquid phase epitaxy followed by annealing treatment were studied in the range 450 C-900 C. A detailed analysis of As and interstitial profiles reveals that arsenic diffuses, starting from 550 C, in two stages: as an interstitial-arsenic complex for 550 C≤ T≤ 650 C and independently of interstitials for T≥ 750* C. It is shown that interstitials are created during the liquid to solid transformation prior to the annealing treatments.ABSTRACT

Publisher
CRC Press
Origin
Microscopy of Semiconducting Materials, 1987
Legacy ID
2c66c87db9e407d8145f26486fad57e9
Biblio references
Pages: 491-496