Symmetry and planar chirality measured with a log-polar transformation in a transmission electron microscope

Publication date: 31 Lug 2024

JournalSource: OPENALEXOpenAlex type: articleOpen Access
Authors: Amir H. Tavabi, Paolo Rosi, Raimond B. G. Ravelli, Abril Gijsbers, Enzo Rotunno, Tuğrul Güner, Yingwen Zhang, Alberto Roncaglia, Luca Belsito, G. Pozzi, Thibaud Denneulin, G. C. Gazzadi, M. R. Ghosh, Reindert Nijland, Stefano Frabboni, Peter J. Peters, Ebrahim Karimi, Peter Tiemeijer, Rafal E. Dunin–Borkowski, Rafal E. Dunin‐Borkowski, Vincenzo Grillo

Chirality can appear at many length scales in nature. In this study the authors introduce planar chirality as a quantitative geometric measure of chirality for two-dimensional objects. They apply this measure to evaluate the chirality of nanometer-sized structures with an electron microscope. They employ an innovative electron-optics device, the orbital-angular-momentum sorter, which applies a log-polar conformal mapping to the electron wave function and reaches near-optimal resolution in orbital angular momentum.

Origin
Physical Review Applied
Volume
22
Issue
1
Cited by
3
Legacy ID
bef54c170b173ad5e415029b518c2907
Biblio references
Volume: 22 Issue: 1 Pages: 014083