By means of numerical simulations, we demonstrate the innovative use of computational ghost imaging in transmission electron microscopy to retrieve images with a resolution that overcomes the limitations imposed by coherent aberrations. The method requires measuring the intensity on a single pixel detector with a series of structured illuminations. The success of the technique is improved if the probes are made to resemble the sample and the patterns cover the area of interest evenly. By using a simple 8 electrode device as a specific example, a twofold increase in resolution beyond the aberration limit is demonstrated to be possible under realistic experimental conditions.