PUBBLICAZIONI

JournalSource: OPENALEXOpenAlex type: erratumOpen Access

Authors: Umberto Amato, Anestis Antoniadis, Italia De Feis, Anastasiia Doinychko, Irène Gijbels, Antonino La Magna, Daniele Pagano, F Piccinini, Easter S. Suviseshamuthu, Carlo Severgnini, Andres Torres, Patrizia Vasquez

In the published publication [...].

Origin

Sensors

Volume

Issue

Pages

5124

Cited by

Apri pubblicazione Open Access

Correction: Amato et al. Detecting Important Features and Predicting Yield from Defects Detected by SEM in Semiconductor Production. Sensors 2025, 25, 4218

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