Pubblicazioni
- Insights into ALD Growth of Al-Based Dielectric Stack on 4H-SiC
- Structural Properties and Energy Band Alignment of Crystalline AlN Grown by Atomic Layer Deposition on Epitaxial Graphene
- Calculation of the Whole Interface State Density Profile in SiO<sub>2</sub>/SiC Lateral MOSFETs
- Electrical Characterization of Mo-Carbide Schottky Contacts on 4H-SiC
- Energy Band Alignment and Electro‐Optical Behavior of Nearly Unstrained Monolayer MoS <sub>2</sub> Heterostructures With GaN
- Irradiation‐Resistant Heterostructures Based on Monolayer MoS <sub>2</sub>
- Two-dimensional Materials and Wide Bandgap Semiconductors: integration challenges and novel device applications
- Modeling of Non-Ideal Ni/Ga <sub>2</sub> O <sub>3</sub> Schottky Contacts by Two-Barrier Thermionic Emission Model
- Scalable Dielectrics Technology for 2D Materials Electronics
- Impact of the Schottky Barrier and Contact‐Induced Strain Variations inside the Channel on the Electrical Behavior of Monolayer MoS <sub>2</sub> Transistors
- Effects of Sulfurization on the Properties of 4H-SiC Schottky Contacts
- Evolution of the Electrical and Microstructural Properties of Mo/4H-SiC Contact with the Annealing Temperature
- Structural and electrical properties of AlGaN/GaN heterostructures grown on 2°-off-axis 4H–SiC epilayers
- Understanding the impact of extended crystalline defects on 4H-SiC power MOSFETs by multiscale correlative electrical, optical and thermal characterizations
- 2D Materials: Processing and applications
- Thermal annealing effects on the electrical and structural properties of Mo Schottky contacts to n-type 4H-SiC
- Special Issue: 2D Layered Nanomaterials and Heterostructures for Electronics, Optoelectronics, and Sensing
- Scalable growth of optically uniform MoWS2 alloys by sulfurization of ultrathin Mo/W stacks
- Understanding the impact of extended crystalline defects on 4H-SiC power MOSFETs by multiscale correlative electrical, optical and thermal characterizations
- Impact of Processing Parameters on Ti Schottky Contacts on 4H-SiC
