Patrick Fiorenza
II livello - I Ricercatore
Profili scientifici
310
Totale pubblicazioni
2005
Prima pubblicazione
2026
Ultima pubblicazione
Le ultime pubblicazioni
Vedi tutte le pubblicazioni- Insights into ALD Growth of Al-Based Dielectric Stack on 4H-SiC
- Calculation of the Whole Interface State Density Profile in SiO<sub>2</sub>/SiC Lateral MOSFETs
- Electrical Characterization of Mo-Carbide Schottky Contacts on 4H-SiC
- Challenges in 1SSF Detection in 4H-SiC Epilayer and Related Failure
- Energy Band Alignment and Electro‐Optical Behavior of Nearly Unstrained Monolayer MoS <sub>2</sub> Heterostructures With GaN
- Modeling of Non-Ideal Ni/Ga <sub>2</sub> O <sub>3</sub> Schottky Contacts by Two-Barrier Thermionic Emission Model
